Acceleration Factors with Examples
Speaker: Fred Schenkelberg
When conducting an accelerated life test it is essential to carefully consider the acceleration factor (AF). Like warp drives shortening distance, accelerated life tests (ALT) attempt to shorten time. Think warp factor and acceleration factor as being similar, well sort of.
Let’s explore the crucial element of any ALT. What is AF? How is it used? And how do we know we have a ‘good’ one? There are plenty of problems and pitfalls, let’s avoid those and interpret our ALTs well.
Plus, let’s examine a few example AFs in a range of situations, plus a brief discussion around how to create a meaningful AF on your own.
This Accendo Reliability webinar originally broadcast on 9 February 2021.
The audio track is now an Accendo Reliability Webinar Series podcast episode. View the episode show notes to listen or subscribe to the podcast.
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Thank you for the very informative presentation. I’m glad I didn’t try and propose accelerated testing on a complete electronic device with many different circuits and technologies. It appears that in order to be effective you really have to pin point what you want out of the accelerated test and keep it focused to only a prominent failure mechanism.
Fred Schenkelberg says
thanks Don – yes, an ALT is really only useful (or very complex) when focused on one failure mechanism. cheers, Fred