Quantifying Life in Solid State Electronics
Join Kirk and Fred as they discuss the life of semiconductors and passive components, and the need and relevance of models that are based on intrinsic wear out failure mechanisms.
- Fred’s experience with a wearable water-resistant product that failed after exposure to water immersion testing
- Engineers design away from known causes of failure, and many failures are from overlooked margin errors or assembly.
- The difficulty of estimating the life cycle environmental profile for smartphones and other widely distributed consumer electronics
Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques, to field data analysis approaches.
For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.