How to Best Learn from Previous Products
Join Kirk and Fred as they discuss
- Suppliers common failure analysis results such as EOS (Electrical Over-stress) that may not be detailed information
- Prevention of field failures does not get as much attention as the the field service department that rescues the customer by getting the system working again.
- Many times failure data and tribal knowledge gets lost in the dynamic movement of the engineering work force
Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques, to field data analysis approaches.
For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.