The Number One Challenge for HALT
Join Kirk and Fred as they discuss the challenge of getting buy-in to improve an electronics systems margins above specifications, even if it is a low cost change
- Commercial competitive manufacturers are much more likely to increase the margins for reliability due to the fact that the customers can buy from several manufacturers when they are dissatisfied with its reliability
- A HALT application may be significantly different from classical HALT when targeting a specific failure mechanism, such as finding a mismatch of BGA underfill thermal coefficient of expansion causing BGA cracking.
- Understanding of failure mechanisms is key to all reliability testing, but how fatigue or chemical processes will produce cumulative damage that can be rapidly discovered with HALT is the key to getting other engineers to understand HALT methodology.
Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques, to field data analysis approaches.
Here is a link to Kirk’s book co-authored with John J. Paschkewitz available from Amazon “Next Generation HALT and HASS: Robust Design of Electronics and Systems”