Digital Circuits and the Stuck at Fault Model
Semiconductor Integrated Circuits (ICs) can have millions of digital circuits which can translate to billions of transistors.
I know these numbers can be intimidating, but I assure you the challenges of testing ICs started in the mid-late 1970’s. Lots of effort has been put into Electronic Design Automation (EDA) systems and Design for Test (DFT) techniques to manage the development and application of digital circuit testing.
In the beginning these software programs and DFT techniques used the Stuck at Fault Model. [Read more…]