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Next Generation HALT and HASS: Robust Design of Electronics and Systems

By John J. Paschkewitz and Kirk A. Gray

Next Generation HALT and HASS: Robust Design of Electronics and Systems
$100 to $105
  • Publisher: Wiley
  • Edition: 1st
  • Available in: Hardcover, Kindle
  • ISBN: 978-1118700235
  • Published: May 23, 2016
Amazon hardcover ~$105Amazon Kindle ~$100

Kirk Gray picture for Accendo ReliabilityHALT and HASS: Robust Design of Electronics and Systems co-author Kirk Gray is a regular co-host with the Speaking of Reliability podcast. You can learn more about Kirk via his bio.


 

The HALT and HASS book benefits for you:

  • Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS.
  • Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development method.
  • Guides the process from customer needs and risk assessment to accelerated test to find product limits and weaknesses to corrective action and confirming robust and reliable products in production.
  • Illustrates how the HALT Methodology can be extended to other products and stresses
  • Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits.
  • Provides a guide to moving from MTBF and reliability prediction to more practical, direct and efficient latent defect discovery methods
  • `Presents a case history and the physics to explain and illustrate how thermal, voltage and other HALT stresses help discover marginal signal integrity and software issues.

Series: Accendo Authors Tagged with: testing, tools

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