
Let’s discuss the Arrhenius model. One thing you didn’t know about is that you may already be an expert in it. How could that be you ask? You have probably used it many times at home. [Read more…]
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Let’s discuss the Arrhenius model. One thing you didn’t know about is that you may already be an expert in it. How could that be you ask? You have probably used it many times at home. [Read more…]

Traditional electronics reliability engineering began during the period of infancy in solid state electronic hardware. The first comprehensive guide to Failure Prediction Methodology (FPM) premiered in 1956 with the publication of the RCA release TR-1100: “Reliability Stress Analysis for Electronic Equipment” presented models for computing rates of component failures. “RADC Reliability Notebook” emerged later in 1959, followed by the publication of a military handbook know as that addressed reliability prediction known as Military Handbook for [Read more…]
by Fred Schenkelberg Leave a Comment

Next week is RAMS – the Reliability and Maintainability Symposium. A multitrack 3.5-day conference with classes, tutorials, paper sessions, a small trade show, plus many of you – peers, colleagues, and friends in the reliability world.
The conference is hosted by 9 professional societies and organized by a group of about 50 or so volunteers from those societies (I was an active member of the RAMS management committee for many years). [Read more…]
by Fred Schenkelberg 5 Comments

None, actually.
Or, one really good reliability engineering professional.
Or, an entire staff of highly talented reliability engineers.
The number of reliability engineers on staff really doesn’t matter. The outcome of your product and system reliability is not contingent on headcount or office space or list of degrees. [Read more…]

In all aspects of engineering we only make improvements and innovation in technology by building on previous knowledge. Yet in the field of reliability engineering (and in particular electronics assemblies and systems), sharing the knowledge about field failures of electronics hardware and the true root causes is extremely limited. Without the ability to share data and teach what we know about the real causes of “un-reliability” in the field, it is more easily understood why the belief in the ability able to model and predict the future of electronics life and MTBF continue to dominate the field of electronics reliability
by Fred Schenkelberg Leave a Comment

One way to capture and disseminate reliability engineering related information and advice is through internal documents. This of course only works if they are both useful and used.
Focus on gathering and providing essential and meaningful information that will improve the reliability of your product. Another element that makes these design guidelines valuable is if they save time. Engineers love to save time. [Read more…]

When we go to an automobile race such as the Indianapolis 500, watching those cars circle the track can get fairly boring. What is secretly unspoken is that everyone observing the race is watching for a race car to find and sometimes exceed a limit, finding a discontinuity. The limit could be how fast he enters a curve before the acceleration forces exceed the tires coefficient of friction, or how close to the racetrack wall, he can be before he contacts it and spins out of control. Using the race analogy, [Read more…]
by Fred Schenkelberg 2 Comments

Monte Carlo relies on data that describes the variation of elements within the system. It also connects the elements such that they result is an estimate of performance.
For reliability modeling, this is easiest to imagine for a series system.
For a system with two elements in series, a very simple reliability block diagram multiples the expected reliability for each block to determine the system reliability value. Yet, it is possible to have both elements at the low end of the range of possible reliability values, or the high end or a mix.
That is the value of the Monte Carlo approach. [Read more…]

Most reliability engineers are familiar with the life cycle bathtub curve, the shape of the hazard rate or risks of failure of a electronic product over time. A typical electronic’s life cycle bathtub curve is shown in figure 1. [Read more…]
by Fred Schenkelberg 4 Comments

Fault Tree Analysis (FTA) is a technique to explore the many potential or actual causes of product or system failure.
Best applied when there are many possible ways something may fail. For example, when my car doesn’t start, it could be a dead battery, faulty started, loose wire, no fuel, and on and on. [Read more…]
by Fred Schenkelberg 9 Comments

Customers experience product failures.
Understanding these failures that occur in the hands of customers is an essential undertaking. We need this information to identify increasing failure rates, component batch or assembly errors, or design mistakes. [Read more…]

Historically Reliability Engineering of Electronics has been dominated by the belief that 1) The life or percentage of complex hardware failures that occurs over time can be estimated, predicted, or modeled and 2) Reliability of electronic systems can be calculated or estimated through statistical and probabilistic methods to improve hardware reliability. The amazing thing about this is that during the many decades that reliabilityengineers have been taught this and believe that this is true, there is little if any empirical field data from the vast majority of verified failures that shows any correlation with calculated predictions of failure rates.
[Read more…]
by Fred Schenkelberg Leave a Comment

Estimating the set of stress and stress curves is an interesting exercise that may have a greater purpose: safety.
The connection is clear when considering the potential consequences of failure.
For example, the loss of braking power when landing an aircraft may result in the aircraft rolling off the end of the runway. This could be into a river or road and may have a rather poor outcome not only for the aircraft. [Read more…]
by Fred Schenkelberg 3 Comments

Ideally, in every design of every component, the stress–strength relationship looks like this figure. The stress is well below the strength.
This implies there is very little chance of failure due to the element being overstressed.
Also, ideally, we fully characterize all stresses and all strengths for each element of a product. This is generally difficult to accomplish and it is rarely done to that extent.
by Fred Schenkelberg Leave a Comment

Every once in a while I see a comment that by following the HALT methodology you will “over design” a product.
Many question at what point or operational limit do you quit increasing the stress-strength margins. Those who hold this view of HALT do not understand the essence of what was Gregg Hobbs’ principles and paradigm shift. [Read more…]
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