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Home » Archives for Kirk Gray » Page 15

Kirk Gray — Active Contributor

Author of Accelerated Reliability articles and Next Generation HALT and HASS, plus, co-host on Speaking of Reliability.


This author's archive lists contributions of articles and episodes.

by Kirk Gray Leave a Comment

Required Case History for Reliability Engineers

Required Case History for Reliability Engineers

One for the (Reliability) Books

The GM Ignition switch failure case history should be required reading for all reliability engineers.

It is rare to have insight into any internal company history of serious electronic and electromechanical failures. Failure analysis and the causes of electronics or electromechanical systems failure can be a difficult investigation for any manufacturing company. Disclosure of the history and data is rarely if ever published due to the potential liability and litigation costs as well as loss of reputation for reliability and safety.

[Read more…]

Filed Under: Accelerated Reliability, Articles, on Product Reliability Tagged With: Field data analysis

by Kirk Gray Leave a Comment

Eliminating early life failures

Eliminating early life failures

MTBF for electronics life entitlement measurements is a meaningless term. It says nothing about the distribution of failures or the cause of failures and is only valid for a constant failure rate, which almost never occurs in the real world. It is a term that should be eliminated along with reliability predictions of electronics systems with no moving parts. [Read more…]

Filed Under: Accelerated Reliability, Articles, on Product Reliability Tagged With: Highly Accelerated Life Testing (HALT)

by Kirk Gray 2 Comments

Electronics Failure Prediction Methodology does not work

Electronics Failure Prediction Methodology does not work

 

“When the number of factors coming into play in a phenomenological complex is too large, scientific method in most cases fails.  One need only think of the weather, in which case the prediction even for a few days ahead is impossible.” ― Albert Einstein

“Prediction is very difficult, especially about the future.” – Niels Bohr* We have always had a quest to reduce future uncertainties and know what is going to happen to us, how long we will live, and what may impact our lives.  Horoscopes, Tarot

[Read more…]

Filed Under: Accelerated Reliability, Articles, on Product Reliability Tagged With: Life estimation

by Kirk Gray 3 Comments

SOR 062 Are Environmental Standards Useful?

SOR 062 Are Environmental Standards Useful?

Are Environmental Standards Useful?

Abstract

Kirk and Fred discuss the marginal value of environmental standards.
ᐅ Play Episode

by Kirk Gray Leave a Comment

SOR 061 Where Do Environmental Specifications Come From?

SOR 061 Where Do Environmental Specifications Come From?

Where Do Environmental Specifications Come From?

Abstract

Kirk and Fred discuss where environmental specifications should come from and why they don’t all too often.
ᐅ Play Episode

by Kirk Gray Leave a Comment

SOR 060 Can We Reduce Early Life Failures?

SOR 060 Can We Reduce Early Life Failures?

Can We Reduce Early Life Failures?

Abstract

Kirk and Fred discuss a few ideas on minimizing early field failures with your product.
ᐅ Play Episode

by Kirk Gray Leave a Comment

Why success with HALT begins long before doing HALT

Why success with HALT begins long before doing HALT

Implementing a new reliability development paradigm in a company which is using traditional, standards-based testing can be a perilous journey.

It is especially true with introducing HALT (Highly Accelerated Life Test) in which strength against stress, and not quantifying electronics lifetimes is the new metric.  Because of this significant change in test orientation, a critical factor for success begins with educating the company’s top  [Read more…]

Filed Under: Accelerated Reliability, Articles, on Product Reliability Tagged With: Highly Accelerated Life Testing (HALT)

by Kirk Gray Leave a Comment

Why HALT is a methodology, not equipment

Why HALT is a methodology, not equipment

It is easy to understand why the term HALT (Highly Accelerated Life Test) is so tightly couple to the equipment called “HALT chambers” systems.  Many do not think they can do HALT processes without a “HALT Chamber”. Many know that Dr. Gregg Hobbs, who coined the term HALT and also HASS (Highly Accelerated Stress Screens), spent much of his life promoting the techniques and was also the founder of two “HALT/HASS” environmental chamber companies. [Read more…]

Filed Under: Accelerated Reliability, Articles, on Product Reliability Tagged With: Highly Accelerated Life Testing (HALT)

by Kirk Gray Leave a Comment

Why Parametric Variation Can Lead to Failures and HALT Can Help

Why Parametric Variation Can Lead to Failures and HALT Can Help

Many reliability engineers have discovered HALT will quickly find the weaknesses and reliability risks in electronic and electromechanical systems from the capability of thermal cycling and vibration to create rapid mechanical fatigue in electronic assemblies. Assemblies that have latent defects such as cold solder or cracked solder joints, loose connectors or mechanical fasteners, or component package defects can be brought to a detectable, or patent, condition by which we can observe and potentially improve the robustness of an electronics system.

[Read more…]

Filed Under: Accelerated Reliability, Articles, on Product Reliability Tagged With: Highly Accelerated Life Testing (HALT)

by Kirk Gray Leave a Comment

Reliability Paradigm Shift From Time to Stress Metrics

Reliability Paradigm Shift From Time to Stress Metrics

Traditional electronics reliability engineering began during the period of infancy in solid state electronic hardware. The first comprehensive guide to Failure Prediction Methodology (FPM) premiered in 1956 with the publication of the RCA release TR-1100:  “Reliability Stress Analysis for Electronic Equipment” presented models for computing rates of component failures.  “RADC Reliability Notebook” emerged later in 1959, followed by the publication of a military handbook know as  that addressed reliability prediction known as Military Handbook  for [Read more…]

Filed Under: Accelerated Reliability, Articles, on Product Reliability Tagged With: Metrics

by Kirk Gray Leave a Comment

What will Advance Reliability Engineering?

What will Advance Reliability Engineering?

In all aspects of engineering we only make improvements and innovation in technology by building on previous knowledge. Yet in the field of reliability engineering (and in particular electronics assemblies and systems), sharing the knowledge about field failures of electronics hardware and the true root causes is extremely limited. Without the ability to share data and teach what we know about the real causes of “un-reliability” in the field, it is more easily understood why the belief in the ability able to model and predict the future of electronics life and MTBF continue to dominate the field of electronics reliability

[Read more…]

Filed Under: Accelerated Reliability, Articles, on Product Reliability

by Kirk Gray Leave a Comment

SOR 031 Troubleshooting Failure Analysis

SOR 031 Troubleshooting Failure Analysis

Troubleshooting Failure Analysis

Abstract

Kirk and Fred discuss steps that should be followed when trying to find the location and cause of failures in electronics.

They use examples of from their own experiences with recent failures of appliances and personal computers and how using a systematic approach to investigating failures is the best way to discover the causes of failures.
ᐅ Play Episode

by Kirk Gray

SOR 030 What Do I Need to Detect Failures?

SOR 030 What Do I Need to Detect Failures?

What Do I Need to Detect Failures?

Abstract

Kirk and Fred discuss how to know when a failure occurs during a stress test to find operational and destruct limits.

In some cases, the failure and component causing the failure are very obvious when “the smoke comes out”.

In other cases, the product being tested has a performance degradation under increased stress that can be used as discriminators for ensuring reliability and quality during product development and manufacturing.

They also discuss how some fundamental technology limitations of common operational monitors, such as a display LCD, does not have to limit the stress to the more typically more capable circuit board assembly.
ᐅ Play Episode

by Kirk Gray Leave a Comment

For Maximum Test Value, Take it to the Limit!

For Maximum Test Value, Take it to the Limit!

When we go to an automobile race such as the Indianapolis 500, watching those cars circle the track can get fairly boring. What is secretly unspoken is that everyone observing the race is watching for a race car to find and sometimes exceed a limit, finding a discontinuity. The limit could be how fast he enters a curve before the acceleration forces exceed the tires coefficient of friction, or how close to the racetrack wall, he can be before he contacts it and spins out of control. Using the race analogy, [Read more…]

Filed Under: Accelerated Reliability, Articles, on Product Reliability Tagged With: Highly Accelerated Life Testing (HALT)

by Kirk Gray Leave a Comment

Why the Drain in the Bathtub Curve Matters

Why the Drain in the Bathtub Curve Matters

Most reliability engineers are familiar with the life cycle bathtub curve, the shape of the hazard rate or risks of failure of a electronic product over time. A typical electronic’s life cycle bathtub curve is shown in figure 1. [Read more…]

Filed Under: Accelerated Reliability, Articles, on Product Reliability

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