MEOST Setup Remotely

Abstract

Kirk and Fred discussing Multiple Environmental Over Stress Test or MEOST.

Key Points

Join Kirk and Fred as they discuss the term MEOST and how it is very similar to HALT in the use of stress to find latent defects or weaknesses.
Topics include:

• Gregg Hobbs was very possessive of the term HALT which he had coined for his strength limit testing, so many organizations use other acronyms to describe HALT.
• Fred’s favorite stress in HALT or MEOST is vibration on mounted components especially the ones that can move relative to each other. That condition often leads to reliability issues and is why vibration HALT is so useful for Power supplies.
• Trying to conduct or direct at HALT or MEOST in remote labs is extremely difficult if not impossible to do if the lab does not have a thorough understanding of HALT and the goals of HALT since most companies will not increase margins beyond stress specifications.
• The second question is about testing for a photo diode reliability issue. There are so many possibilities of the cause, a deep failure analysis and measurements need to be made before determining the stresses needed to screen the units.

Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.

SOR 806 MEOST Setup RemotelyKirk Gray

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Show Notes

You can now purchase the recent recording of Kirk Gray’s Hobbs Engineering 8 (two 4 hour sessions) hour Webinar “Rapid and Robust Reliability Development – 2022 HALT & HASS Methodologies Online Seminar” from this link.

Please click on this link to access a relatively new analysis of traditional reliability prediction methods article from the US ARMY and CALCE titled  “Reliability Prediction – Continued Reliance on a Misleading Approach”

For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.

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