When I introduced you to the Stuck at Fault Model I stated that the size of VLSI devices necessitated the usage of Electronic Design Automation (EDA) tools to support testing.
My first full-time job at IBM exposed me to the world of test and to their EDA tools.
In the mid-1980’s, testing of logic devices relied upon the S@ fault model. Three common software tools included fault simulation, automatic test pattern generation, and fault diagnosis.
This article will provide an introduction to fault simulation as one can view the other two tools as applications built upon a fault simulator. [Read more…]