Frequency

The set of environmental factors and range (or distribution) of values during manufacturing, shipping, storage, and use appling (or expected to apply) to an item. This includes factors such as weather (e.g.,temperature, humidity, and wind) and usage (e.g., frequency, human interaction, misuse). Often includes details concerning potential sources of stress(es) on an item. A range provides boundaries for the expected stress, whereas a distribution enables advanced forms of stress analysis.

A graphical display of count, frequency or percentages of failure modes, mechanisms, or sources of variation ordered from highest to lowest contribution to overall product or system issues. A Pareto analysis provides an simple method for an organization to identify the costliest or most often occurring events.

A failure mechanism in silicon based electronic devices. It describes the phenomenon by which carriers gain sufficient energy to be injected into the gate oxide. This occurs as carriers move along the channel in MOSFET and experience impact ionization near the drain end of the device. The damage can occur at the interface, within the oxide and/or within the sidewall spacer. Interface-state generation and charge trapping induced by this mechanism result in transistor parameter degradation, typically switching frequency degradation, rather than a “hard’ functional failure. (Reference JEP122F)

A life limit imposed on an item to reduce the frequency of age-related failures that have economic consequences.

Vibration that exhibits acceleration and frequency values within a time interval in a stochastic manner, acceleration values with a normal (Gaussian) probability density function, and frequency values with a uniform distribution.