When to Consider Reliability
Join Kirk and Fred as they discuss the reliability process and reliability tools and methods and when to apply them.
- Reliability development of a new device or system should start with following good design rules, including design for reliability and design for manufacturing, as well as knowing the variations of the applications in the end-use environments.
- When we think of what type of electrical connectors to use out of the hundreds of types and manufacturers we should be able to estimate what the stresses that the systems will be subjected to during its life cycle. For instance If the use conditions result in high vibration or shock, then a locking connector should be used, versus one that relies on insertion friction.
- Design engineers many times have narrow view of the worst case user and cumulative fatigue damage by them. They may consider any use beyond the published use specifications is customer abuse, although most customers do not even know what the manufacturers specifications are. For instance, How many users do you think know what their smartphone specifications are?
- Product designers tend to design away from failure, but at the same time may assume that users will follow the use specifications, and also not consider the fatigue damage over time even if the use is within the maximum stress specifications.
Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.
You can now purchase the most recent recording of Kirk Gray’s Hobbs Engineering 8 (two 4 hour sessions) hour Webinar “Rapid and Robust Reliability Development – 2022 HALT & HASS Methodologies Online Seminar” from this link.
Please click on this link to access a relatively new analysis of traditional reliability prediction methods article from the US ARMY and CALCE titled “Reliability Prediction – Continued Reliance on a Misleading Approach”
For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.