Bill Tonti, Engineer, IEEE Future Directions
Fred Schenkelberg interviews Bill Tonti about his work and investing in the field of reliability engineering.
[Note: This is a bonus episode recorded at RAMS 2016 in Tucson, AZ. Fred invited thought leaders to join him for a quick interview, thus please pardon the sounds of the conference in the background.]
Bill is a 1978 graduate of Northeastern University, holding a BS in Electrical Engineering.
He joined IBM in Essex Junction Vermont where he has retired after 30+ years of service.
Bill pursued an MS in Electrical Engineering from the University of Vermont, and an MBA from St. Michael’s College. He was selected to participate in the IBM Doctoral Resident Study program, where he completed a Ph.D. in Electrical Engineering from the University of Vermont.
Bill spent the majority of his career working on Advanced Dynamic Random Access Memory semiconductor technology development. Bill has published numerous contributed and invited papers.
He holds an excess of 280 US patents.
Bill has been a member of the IEEE Reliability Society ADCOM and served as their 2006-2008 President. Dr. Tonti was recently named an IBM Master Inventor for life, and a fellow of the IEEE.
Bill has joined the IEEE STAFF in 2009 and is the Sr. Director of IEEE Future Directions.
In this episode, Bill discusses:
- The ultimate limits of silicon lattice dimensions
- The role of fundamental research laboratories
- Sodium as a reliability risk for ICs
- Upcoming ways IoT may work going forward (with intelligence)
Recorded January 2016 at RAMS in Tucson, AZ.
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