Your Reliability Engineering Professional Development Site
Andre and Fred discuss the basic approaches for proper data analysis depending on the data source.
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Taken in entirety from http://prdweb.asq.org/certification/control/reliability-engineer/bok on April 6th, 2016. This is the 2009 update to the BoK.
Reprinted with permission from American Society for Quality ©2008 ASQ, www.asq.org. No further distribution allowed without permission.
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Taken in entirety from https://p.widencdn.net/evlmel/certified-reliability-engineer on August 6th, 2018. This is the 2018 update to the CRE BoK.
Reprinted with permission from American Society for Quality ©2018 ASQ, www.asq.org. No further distribution allowed without permission.
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just a test
MTBF for electronics life entitlement measurements is a meaningless term. It says nothing about the distribution of failures or the cause of failures and is only valid for a constant failure rate, which almost never occurs in the real world. It is a term that should be eliminated along with reliability predictions of electronics systems with no moving parts. [Read more…]
Tim Rodgers interviews Fred Schenkelberg concerning his blog, No MTBF and his mission to eradicate the common misuse of MTBF.
“When the number of factors coming into play in a phenomenological complex is too large, scientific method in most cases fails. One need only think of the weather, in which case the prediction even for a few days ahead is impossible.” ― Albert Einstein
“Prediction is very difficult, especially about the future.” – Niels Bohr* We have always had a quest to reduce future uncertainties and know what is going to happen to us, how long we will live, and what may impact our lives. Horoscopes, Tarot
Implementing a new reliability development paradigm in a company which is using traditional, standards-based testing can be a perilous journey.
It is especially true with introducing HALT (Highly Accelerated Life Test) in which strength against stress, and not quantifying electronics lifetimes is the new metric. Because of this significant change in test orientation, a critical factor for success begins with educating the company’s top [Read more…]
Tim and Fred address a question posed by a listener about a supplier who changed the reliability specification, and what can be done to help ensure that the customer’s standards are being met.
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Many reliability engineers have discovered HALT will quickly find the weaknesses and reliability risks in electronic and electromechanical systems from the capability of thermal cycling and vibration to create rapid mechanical fatigue in electronic assemblies. Assemblies that have latent defects such as cold solder or cracked solder joints, loose connectors or mechanical fasteners, or component package defects can be brought to a detectable, or patent, condition by which we can observe and potentially improve the robustness of an electronics system.
Traditional electronics reliability engineering began during the period of infancy in solid state electronic hardware. The first comprehensive guide to Failure Prediction Methodology (FPM) premiered in 1956 with the publication of the RCA release TR-1100: “Reliability Stress Analysis for Electronic Equipment” presented models for computing rates of component failures. “RADC Reliability Notebook” emerged later in 1959, followed by the publication of a military handbook know as that addressed reliability prediction known as Military Handbook for [Read more…]
In all aspects of engineering we only make improvements and innovation in technology by building on previous knowledge. Yet in the field of reliability engineering (and in particular electronics assemblies and systems), sharing the knowledge about field failures of electronics hardware and the true root causes is extremely limited. Without the ability to share data and teach what we know about the real causes of “un-reliability” in the field, it is more easily understood why the belief in the ability able to model and predict the future of electronics life and MTBF continue to dominate the field of electronics reliability
