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Abstract
Kirk and Fred discuss the 10th anniversary of the publication of Kirk’s book, Next Generation HALT and HASS: Robust Design of Electronics and Systems.
Key Points
Join Kirk and Fred as they discuss the reasons and relevance of writing a book on HALT and HASS and why it was intended to be applicable to future electronics, even as the materials, methods, and density of electronics continue to evolve.
Topics include:
- For the vast majority of electronics, especially consumer electronics, technological obsolescence comes long before the components fail because they have used up all their intrinsic life or “wear out.”
- Mechanical systems, those that have material wear, such as gears, mechanical switches, tires on cars, can wear out, and models can be made from experimental data. Batteries will also wear out in time, and their life can be reasonably modeled.
- Extreme stress conditions, such as electronics used in automobiles, oil drilling equipment, and measurement while drilling (MWD), have demonstrated that semiconductors and circuits can have significant margins.
- Higher stress margins can be demonstrated to have higher reliability if the margins found during HALT of subsystems are compared with field failure rates, and a business case can then be made for margins being increased to the fundamental limits of technology. Dr. Ed Kyser did a presentation on this analysis of Cisco switching systems many years ago.
Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.
Show Notes
Please click on this link to access a relatively new analysis of traditional reliability prediction methods article from the US ARMY and CALCE titled “Reliability Prediction – Continued Reliance on a Misleading Approach”. It is in the public domain, so please feel free to distribute it. Attempting to predict reliability is a misleading and costly approach to use for developing a reliable system.
If you would like to learn more about using HALT (Highly Accelerated Limit Tests) and HASS (Highly Accelerated Stress Screens), please follow this link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems,” written by Kirk Gray and John Paschkewitz. It can also be found on Amazon Books at this link.
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