Jim McLinn ASTR Conference

Fred interviews Jim McLinn about the annual ASTR conference.

2017 Accelerated Stress Testing and Reliability (ASTR) Conference

Sponsored by IEEE Reliability Society and ASQ Reliability Division

Exceeding Customer Expectations Through Accelerated Life Testing

September 27 – 29, 2017

Hilton Garden Inn Downtown, Austin, Texas 512 480-8181

www.ieee-astr.org

The 2017 Accelerated Stress Testing and Reliability (ASTR) Conference is focused on highlighting cutting-edge methods to deliver maximum cost-benefits from accelerated reliability testing. ASTR 2017 is relevant to product development, test and manufacturers involved in the aerospace, automotive, consumer electronics, defense, biomedical, telecommunications, software and other leading industries where reliability is a key driver of operational and business success. ASTR 2017 will present detailed case studies, best practices, lessons learned, and clear insight on how to best apply and integrate accelerated testing tools and methods.

Students welcome to present research.
The 2017 focus will include (but not limited to):

• The science of test acceleration: integration of design modeling, analysis and accelerated testing
• New Accelerated Test Standards in progress
• Effects of corrosion and high energy radiation on reliability
• Highly Accelerated Life Testing (HALT) and Highly Accelerated Stress Screening (HASS)
• Selecting Sample Size
• Develop life test plans

Become part of this active, growing conference sponsored by both the ASQ-Reliability Division and the IEEE- Reliability Society. The hotel has special rates for this conference.

There are many reasons to attend this conference! Make this your fall destination:

Don’t Miss this conference. There will be speakers from many countries. Check the Website now for the tentative program topics and speakers. See www.ieee-astr.org

Recorded January 2017.

DTK Jim McLinn ASTR ConferenceTim Rodgers

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www.ieee-astr.org