Is a Test to Pass Useful?
Join Kirk and Fred as they discuss testing beyond the “good enough” stress level and what can be found if testing to operational limits
- Kirk discusses a the FA of a long term reliability issue found with a new AC-DC battery charger temperature cause failure that may only have been found with long thermal testing.
- The testing strategy for finding the same failure would require power cycling and long term high temperature dwell times.
- There is a great amount of variable performance and parametric data that can be used for comparisons of lot to lot and supplier components variations that may cause failures.
Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.
Click on this link to access the article “Reliability Prediction – A Continued Reliance on a Misleading Approach”
For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.