Futility of Using MTBF to Design an ALT
Let’s say we want to characterize the reliability performance of a vendor’s device. We’re considering including the device within our system, if and only if, it will survive 5 years reasonably well.
The vendor’s data sheet lists an MTBF value of 200,000 hours. A call to the vendor and search of their site doesn’t reveal any additional reliability information. MTBF is all we have.
We don’t trust it. Which is wise.
Now we want to run an ALT to estimate a time to failure distribution for the device. The intent is to use an acceleration model to accelerate the testing and a time to failure model to adjust to our various expected use conditions.
Given the device, a small interface module with a few buttons, electronics, a display and enclosure, and the data sheet with MTBF, how can we design a meaningful ALT? [Read more…]