Understanding Use Profiles
Abstract
Kirk and Fred discussing the planning of the user profiles and use conditions that engineers must make during the design process
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Author of Accelerated Reliability articles and Next Generation HALT and HASS, plus, co-host on Speaking of Reliability.
This author's archive lists contributions of articles and episodes.
Kirk and Fred discussing the planning of the user profiles and use conditions that engineers must make during the design process
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Kirk and Fred discussing when a failure rate of a product is acceptable or not acceptable.
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Kirk and Fred discussing when to act on improvement of reliability from testing, HALT results, or change in field failure rates
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Kirk and Fred discussing doing failure analysis and the challenges
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Kirk and Fred discussing the new challenges in reliability engineering, which maybe the old challenges of moving away from the misleading approach of Failure Prediction Methodology (FPM) and for Fred its the continued use of MTBF as a metric for reliability.
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Kirk and Fred discussing the classic bathtub curve used in reliability engineering to define the life cycle of electronics and systems.
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Kirk and Fred discussing the challenge of getting samples and the conclusions that can be drawn from testing and analyzing a low number of samples
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Kirk and Fred discussing the changes in professional conferences and seminars due to the worldwide COVID-19 pandemic
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Kirk and Fred discussing a question on testing of a single transistor for reliability assurance.
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Kirk discusses a very interesting failure mechanism in a Voltage Controlled Oscillator (VCO) design and manufacturing company he briefly worked at and what the detailed failure analysis showed.
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Kirk discusses the reason he wrote a book, co-authored with John Paschkewitz, on basic HALT and HASS methods along with new developments and opportunities to use HALT methods for digital software-hardware failure issues.
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Kirk discusses the continued reliance on the misleading approach of using reliability prediction for reliability development.
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Kirk discusses the many times his home appliances failing and doing his own failure analysis and the limitations.
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Kirk discusses his experiences in semiconductor manufacturing and systems manufacturing that led him to an understanding and agreement of the radical ideas that Gregg Hobbs was proposing with HALT and HASS methods.
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Kirk and Fred discussing a listener’s question on how to get started with HALT (Highly Accelerated Limit Test).
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