MTBF, Reliability, and the Curve
Abstract
Kirk and Fred discussing how testing a small sample size of a new product results on a larger margin of error for the larger population.
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SOR 591 MTBF, Reliability, and the Curve
SOR 590 The Balance of Good Enough
The Balance of Good Enough
Abstract
Kirk and Fred discussing the trade-offs between selling more reliable equipment for different markets, costs, and how reliable can we make a product
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SOR 581 Testing Without Knowing Mechanisms
Testing Without Knowing Mechanisms
Abstract
Kirk and Fred discussing how to test a new product without knowing the specific mechanisms that will be a possible weakness, and reliability issue in the field
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SOR 580 Understanding Use Profiles
Understanding Use Profiles
Abstract
Kirk and Fred discussing the planning of the user profiles and use conditions that engineers must make during the design process
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SOR 570 Policy – Minimum Acceptable Failure Analysis
Policy – Minimum Acceptable Failure Analysis
Abstract
Kirk and Fred discussing when a failure rate of a product is acceptable or not acceptable.
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SOR 569 Dealing with False Positives or False Negatives
Dealing with False Positives or False Negatives
Abstract
Kirk and Fred discussing when to act on improvement of reliability from testing, HALT results, or change in field failure rates
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SOR 563 Tips on Failure Analysis
Tips on Failure Analysis
Abstract
Kirk and Fred discussing doing failure analysis and the challenges
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SOR 562 What are the New Challenges in Reliability Engineering?
What are the New Challenges in Reliability Engineering?
Abstract
Kirk and Fred discussing the new challenges in reliability engineering, which maybe the old challenges of moving away from the misleading approach of Failure Prediction Methodology (FPM) and for Fred its the continued use of MTBF as a metric for reliability.
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SOR 554 Do Customers only Want the Flat Part of the Curve
Do Customers only Want the Flat Part of the Curve?
Abstract
Kirk and Fred discussing the classic bathtub curve used in reliability engineering to define the life cycle of electronics and systems.
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SOR 553 How Many Samples?
How Many Samples?
Abstract
Kirk and Fred discussing the challenge of getting samples and the conclusions that can be drawn from testing and analyzing a low number of samples
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SOR 544 Potential Long Term Changes to Live Professional Development
Potential Long Term Changes to Live Professional Development
Abstract
Kirk and Fred discussing the changes in professional conferences and seminars due to the worldwide COVID-19 pandemic
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SOR 543 Evaluating a Discreet Component for Reliability
Evaluating a Discreet Component for Reliability
Abstract
Kirk and Fred discussing a question on testing of a single transistor for reliability assurance.
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SOR 530 An Interesting Discovery
SOR 530 An Interesting Discovery
Abstract
Kirk discusses a very interesting failure mechanism in a Voltage Controlled Oscillator (VCO) design and manufacturing company he briefly worked at and what the detailed failure analysis showed.
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SOR 524 Why Did I Write a HALT Book
Why Did I Write a HALT Book
Abstract
Kirk discusses the reason he wrote a book, co-authored with John Paschkewitz, on basic HALT and HASS methods along with new developments and opportunities to use HALT methods for digital software-hardware failure issues.
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SOR 518 The Folly of Reliability Predictions
SOR 518 The Folly of Reliability Predictions
Abstract
Kirk discusses the continued reliance on the misleading approach of using reliability prediction for reliability development.
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