Nihal Sinnadurai, Engineer
Tim interviews Nihal Sinnadurai an engineer and organizer of the 1st and 2nd Foundation program.
Professor Doctor Nihal Sinnadurai is the CEO and Chief Technologist of Advanced Technology Transfer Associates, Chair of IEEE’s “Action for Industry” and past Chair of IEEE UK and Ireland. He was formerly Global VP of Reliability and Quality and Corporate Director at Bookham (now Oclaro). He received the 2015 Lifetime Achievement Award by the IEEE Reliability Society, and the 2011 International Award and 2003 Outstanding Achievement Award by the International Microelectronics Society.
Dr. Sinnadurai’s innovations include the deployment of low-cost microelectronics in high-reliability communications systems, inventing HAST in 1968 while at British Telecom Research Labs, and establishing the correct methodology for its use, and inventing Liquid Crystal Micro-Thermography for microelectronics.
In this episode, Rick and Tim discuss:
- The goals and purpose of the 1st & 2nd Foundations
- The need to support reliability professionals when doing the right thing – reliability-wise
- How are the Foundations fundamentally different then professional or private organizations
Recorded November 2016.
- Social:
- Link:
- Embed:
Show Notes
Here is a slideset Nihal used to present to IEEE SERE in June of 2013 that outlines the issues lurking by not completing a proper reliability analysis.
Ticking Time-Bombs in Electronics and Photonics Systems and Networks & Mitigation thereof
Very interesting. The application of academic progress in the engineering work is a challenge not only within reliability but with the limited possibilities to measure the outcome until many years after design we do not have much of a choice. We must use modeling results to improve the design being aware that they are based on accelerated testing and may fail to be valid in field.
Every attempt to bridge the gap between modeling, testing and field with knowledge about the limitations and statistical variations is welcome.